New architecture and systems for wafer inspection are developed.


IFAG, Symate

The two essential parts of the demonstrator are:

  • Assess product definition via automated application simulations as planned via machine learning.
  • Formulate requirements human- and machine-readable to boost automation in subsequent development steps.

The benefits of the investigated approach will be demonstrated along with automotive drive applications and the related integrated circuits (ICs), e.g., MOSFETs, gate drivers, or sensors.

Beyond state-of-the-art developments and impacts

Systematic assessment of and support for the product definitions of microelectronic power products based on regression models, support vector machines, and deep learning to the best of our knowledge is beyond state of the art. The same holds for the relevant aspects of automated design verification based on human- and machine-readable requirements for the same class of products.